Abstract: Accelerated degradation test has been extensively applied to reliability assessment for high reliability and long-life products.To improve the efficiency-cost ratio,the optimal design theory and method of accelerated degradation test becomes a research hot.For the Tweedie exponential diffusion process with a wide range of application,the optimal design of Constant-Stress Accelerated Degradation Test (CSADT) plan was studied.Based on the D-optimality and V-optimality criteria,it was proved theoretically that under the TED process model with a drift parameter being an exponential function of the (transformed) stress level,a multi-level CSADT plan would correspond to a simple CSADT plan using only the minimum and maximum stress levels.Furthermore,the optimum CSADT plans at the minimum and maximum stress levels were given,which provided a strong reference for the development of accelerated degradation tests.Finally,the proposed model and optimal test plans were analyzed by numerical simulation and case analysis,and the effectiveness of the proposed model and optimal test plans was verified.

Key words: reliability, constant-stress accelerated degradation test, Tweedie exponential dispersion process, optimal design

摘要： 加速退化试验是解决高可靠性长寿命产品可靠性评估等问题的重要试验技术,为提高试验的效费比,加速退化试验的优化设计成为了研究热点。目前的优化设计研究,往往是针对某个特殊的退化过程模型,通过数值计算得出优化方案。针对适用范围较广的Tweedie指数扩散过程,开展恒定应力加速退化试验优化设计研究,分别基于D-优化准则和V-优化准则,通过理论证明得出,在漂移参数与(转换)应力水平为指数函数关系的Tweedie指数扩散过程模型下,多应力水平恒定应力加速退化试验最优试验方案为:仅使用最小应力水平和最大应力水平的两应力简单恒定应力加速退化试验。进一步,给出了最小应力和最大应力水平下的样本分配方案,这些结果为加速退化试验的开展提供了有力参考。最后,通过数值模拟和实例分析对所提模型及最优试验方案进行了分析,验证了所提模型及优化设计方案的有效性。

关键词: 可靠性, 恒定应力加速退化试验, Tweedie指数扩散过程, 优化设计