Defect detection for PCB by combining shallow features and attention mechanism
LIAO Xinting1,2,ZHANG Jie1+,LYU Shengping3
1.Institute of Artificial Intelligence,Donghua University
2.College of Mechanical Engineering,Donghua University
3.College of Engineering,South China Agricultural University
Online:2024-03-31
Published:2024-04-03
Supported by:
Project supported by the National Natural Science Foundation,China (No.52375485),the Natural Science Foundation of Shanghai Municipality,China (No.22ZR1403000),and the Natural Science Foundation of Guangdong Province,China(No.2021A1515012395).