Fabric defect detection based on window threshold local binary patterns
FU Rong, SHI Mei-hong, XU Bu-gao
1.School of Computer Science, Xian Polytechnic University ,Xi'an 710048,China;2.School of Electronic Engineering, Xidian University ,Xi'an 710075,China;3.Department of Human Ecology,University of Texas at Austin, Texas 78712,USA
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